Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA under Radiation Effects

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dc.contributor.authorOLIVEIRA, A. B.
dc.contributor.authorTAMBARA, L. A.
dc.contributor.authorBENEVENUTI, F.
dc.contributor.authorBENITES, L. A. C.
dc.contributor.authorADDED, N.
dc.contributor.authorAGUIAR, V. A. P.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorKASTENSMIDT, F. L.
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2022-01-12T21:55:08Z
dc.date.available2022-01-12T21:55:08Z
dc.date.issued2020-07-05
dc.description.abstract© 1963-2012 IEEE.This article evaluates the RISC-V Rocket processor embedded in a Commercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA) under heavy-ions-induced faults and emulation fault injection. We also analyze the efficiency of using mitigation techniques based on hardware redundancy and scrubbing. Results demonstrated an improvement of $3\times $ in the cross section when scrubbing and coarse grain triple modular redundancy are used. The Rocket processor presented analogous sensitivity to radiation effects as the state-of-the-art soft processors. Due to the complexity of the system-on-chip, not only the Rocket core but also its peripherals should be protected with proper solutions. Such solutions should address the specific vulnerabilities of each component to improve the overall system reliability while maintaining the trade-off with performance.
dc.description.firstpage1503
dc.description.issuenumber7
dc.description.lastpage1510
dc.description.volume67
dc.identifier.citationOLIVEIRA, A. B.; TAMBARA, L. A.; BENEVENUTI, F.; BENITES, L. A. C.; ADDED, N.; AGUIAR, V. A. P.; MEDINA, N. H.; GUAZZELLI, M. A.; KASTENSMIDT, F. L. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA under Radiation Effects.IEEE Transactions on Nuclear Science, v. 67, n. 7, p. 1503-1510, jul. 2020.
dc.identifier.doi10.1109/TNS.2020.2995729
dc.identifier.issn1558-1578
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3639
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.rightsAcesso Restrito
dc.subject.otherlanguageCommercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA)
dc.subject.otherlanguagefault injection (FI)
dc.subject.otherlanguagefault tolerance
dc.subject.otherlanguageheavy ion
dc.subject.otherlanguageRISC-V
dc.subject.otherlanguagerocket
dc.titleEvaluating Soft Core RISC-V Processor in SRAM-Based FPGA under Radiation Effects
dc.typeArtigo
fei.scopus.citations29
fei.scopus.eid2-s2.0-85088865632
fei.scopus.subjectFault injection
fei.scopus.subjectHardware redundancy
fei.scopus.subjectMitigation techniques
fei.scopus.subjectProper solutions
fei.scopus.subjectSoft processors
fei.scopus.subjectState of the art
fei.scopus.subjectSystem reliability
fei.scopus.subjectTriple modular redundancy
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85088865632&origin=inward
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