Repositório do Conhecimento Institucional do Centro Universitário FEI
 

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URI permanente para esta coleçãohttps://repositorio.fei.edu.br/handle/FEI/798

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  • Artigo 8 Citação(ões) na Scopus
    Study of matching properties of graded-channel SOI MOSFETs
    (2008-01-05) Michelly De Souza; FLANDRE, D.; Marcelo Antonio Pavanello
    In this paper an overall analysis on the matching properties of Graded-Channel (GC) SOI MOSFETs in comparison to conventional SOI transistors is performed. Experimental results show that GC devices present poorer matching behavior in comparison to conventional SOI counterpart for equal mask channel length, whereas for same effective channel length, almost the same matching behavior. The analytical model for the drain current of GC devices is used to investigate the reasons for this matching worsening. Two-dimensional numerical simulations are used to validate the model-based analysis both in linear and saturation regions.
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    Artigo 0 Citação(ões) na Scopus
    Analysis of mismatch on the analog characteristics of GC SOI MOSFETs
    (2018-12-12) ALVES, C. R.; FLANDRE, D.; Michelly De Souza
    © 2018, Brazilian Microelectronics Society. All rights reserved.This paper presents an evaluation of mismatch impact on the analog characteristics of fully-depleted graded-channel (GC) SOI MOSFET. This study is carried out by means of electrical measurements and two-dimensional numerical simulations, comparing GC to uniformly doped transistors. Important basic parameters such as threshold voltage and sub-threshold slope were analyzed as well as analog parameters, namely transconductance, output conductance, Early voltage and intrinsic voltage gain.