Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1068
Title: The low-frequency noise behaviour of graded-channel SOI nMOSFETs
Authors: SIMOEN, Eddy
CLAEYS, Cor
CHUNG, Tsu Ming
FLANDRE, Denis
PAVANELLO, Marcelo A.
MARTINO, João Antonio
RASKIN, Jean Pierre
Issue Date: 2007
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: SIMOEN, Eddy; CLAEYS, Cor; CHUNG, Tsu Ming; FLANDRE, Denis; PAVANELLO, Marcelo A.; MARTINO, João Antonio; RASKIN, Jean Pierre. The low-frequency noise behaviour of graded-channel SOI nMOSFETs. Solid-State Electronics, v. 51, n. 2, p. 260-267, 2007.
Access Type: Acesso Aberto
DOI: 10.1016/j.sse.2007.01.003
URI: https://repositorio.fei.edu.br/handle/FEI/1068
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