Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1089
Title: Temperature and Silicon Film Thickness Influence on the Operation of Lateral SOI PIN Photodiodes for Detection of Short Wavelengths
Authors: DE SOUZA, Michelly
BULTEEL, Olivier
FLANDRE, Denis
PAVANELLO, Marcelo A.
Pavanello, Marcelo Antonio
Issue Date: 2011
Journal: JICS. Journal of Integrated Circuits and Systems (Ed. Português)
ISSN: 1807-1953
Citation: DE SOUZA, Michelly; BULTEEL, Olivier; FLANDRE, Denis; PAVANELLO, Marcelo A.; Pavanello, Marcelo Antonio. Temperature and Silicon Film Thickness Influence on the Operation of Lateral SOI PIN Photodiodes for Detection of Short Wavelengths. JICS. Journal of Integrated Circuits and Systems (Ed. Português), v. 6, n. 2, p. 107-113, 2011.
Access Type: Acesso Restrito
URI: https://repositorio.fei.edu.br/handle/FEI/1089
Appears in Collections:Artigos

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.