Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1103
Title: Low-Frequency Noise and Effective Trap Density of Short Channel P- and N-Types Junctionless Nanowire Transistors
Authors: DORIA, Rodrigo Trevisoli
TREVISOLI, R D
DE SOUZA, Michelly
PAVANELLO, M. A.
Issue Date: 2014
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: DORIA, Rodrigo Trevisoli; TREVISOLI, R D; DE SOUZA, Michelly; PAVANELLO, M. A.. Low-Frequency Noise and Effective Trap Density of Short Channel P- and N-Types Junctionless Nanowire Transistors. Solid-State Electronics, v. 96, p. 22-26, 2014.
Access Type: Acesso Aberto
DOI: 10.1016/j.sse.2014.04.019
URI: https://repositorio.fei.edu.br/handle/FEI/1103
Appears in Collections:Artigos

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