Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1104
Title: Extraction of the interface trap density energetic distribution in SOI Junctionless Nanowire Transistors
Authors: TREVISOLI, Renan Doria
DORIA, Rodrigo Trevisoli
DE SOUZA, Michelly
Pavanello, Marcelo Antonio
Issue Date: 2015
Journal: Microelectronic Engineering
ISSN: 0167-9317
Citation: TREVISOLI, Renan Doria; DORIA, Rodrigo Trevisoli; DE SOUZA, Michelly; Pavanello, Marcelo Antonio. Extraction of the interface trap density energetic distribution in SOI Junctionless Nanowire Transistors. Microelectronic Engineering, v. 147, n. 1, p. 23-26, 2015.
Access Type: Acesso Aberto
DOI: 10.1016/j.mee.2015.04.040
URI: https://repositorio.fei.edu.br/handle/FEI/1104
Appears in Collections:Artigos

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