Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1125
Title: Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior
Authors: SOUZA, Michelly de
PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
MARTINO, João Antonio
SIMOEN, Eddy
CLAEYS, Cor
Issue Date: 2007
Journal: Microelectronic Engineering
ISSN: 0167-9317
Citation: SOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor. Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior. Microelectronic Engineering, v. 84, n. 10, p. 2121-2124, 2007.
Access Type: Acesso Aberto
DOI: 10.1016/j.mee.2007.04.116
URI: https://repositorio.fei.edu.br/handle/FEI/1125
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