Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1131
Title: Harmonic distortion analysis of triple gate SOI nanowire MOSFETS down to 100 K
Authors: PAZ, Bruna Cardoso
Doria, Rodrigo Trevisoli
CASSÉ, MIKAËL
BARRAUD, SYLVAIN
REIMBOLD, GILLES
VINET, MAUD
FAYNOT, OLIVIER
Pavanello, Marcelo Antonio
Issue Date: 2017
Journal: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714
Citation: PAZ, Bruna Cardoso; Doria, Rodrigo Trevisoli; CASSÉ, MIKAËL; BARRAUD, SYLVAIN; REIMBOLD, GILLES; VINET, MAUD; FAYNOT, OLIVIER; Pavanello, Marcelo Antonio. Harmonic distortion analysis of triple gate SOI nanowire MOSFETS down to 100 K. MICROELECTRONICS RELIABILITY, v. 79, p. 111-118, 2017.
Access Type: Acesso Aberto
DOI: 10.1016/j.microrel.2017.10.008
URI: https://repositorio.fei.edu.br/handle/FEI/1131
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