Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1139
Title: High Temperature Effects on Harmonic Distortion in Submicron SOI Graded-Channel MOSFETs
Authors: EMAM, Mostafa
PAVANELLO, M.A.
DANNEVILLE, F.
VANHOENACKER-JANVIER, D.
RASKIN, Jean Pierre
Issue Date: 2011
Journal: ADVANCED MATERIALS RESEARCH (ONLINE)
ISSN: 1662-8985
Citation: EMAM, Mostafa; PAVANELLO, M.A.; DANNEVILLE, F.; VANHOENACKER-JANVIER, D.; RASKIN, Jean Pierre. High Temperature Effects on Harmonic Distortion in Submicron SOI Graded-Channel MOSFETs. ADVANCED MATERIALS RESEARCH (ONLINE), v. 276, p. 67-75, 2011.
Access Type: Acesso Aberto
DOI: 10.4028/www.scientific.net/AMR.276.67
URI: https://repositorio.fei.edu.br/handle/FEI/1139
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