Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1318
Title: Diamond layout style impact on SOI MOSFET in high temperature environment
Authors: Gimenez, Salvador Pinillos
GALEMBECK, EGON HENRIQUE SALERNO
RENAUX, CHRISTIAN
FLANDRE, Denis
Issue Date: 2015
Journal: Microelectronics and Reliability
ISSN: 0026-2714
Citation: Gimenez, Salvador Pinillos; GALEMBECK, EGON HENRIQUE SALERNO; RENAUX, CHRISTIAN; FLANDRE, Denis. Diamond layout style impact on SOI MOSFET in high temperature environment. Microelectronics and Reliability, v. 55, n. 5, p. 783/MR11492-788, 2015.
Access Type: Acesso Aberto
DOI: 10.1016/j.microrel.2015.02.015
URI: https://repositorio.fei.edu.br/handle/FEI/1318
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