Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1397
Title: Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
Authors: SILVA, T.F.
ALLEGRO, P.R.P.
CAMPOS, P.H.O.V.
RESTREPO, J.M.
TRINDADE, G.F.
ANTONIO, M.R.
ASSIS, R.F.
LEITE, A.R.
RODRIGUES, C.L.
ADDED, N.
RIZZUTTO, M.A.
TABACNIKS, M.H.
MANGIAROTTI, A.
CURADO, J.F.
AGUIRRE, F.R.
AGUERO, N.F.
Issue Date: 2018
Journal: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN: 0168-583X
Citation: SILVA, T.F.; ALLEGRO, P.R.P.; CAMPOS, P.H.O.V.; RESTREPO, J.M.; TRINDADE, G.F.; ANTONIO, M.R.; ASSIS, R.F.; LEITE, A.R.; RODRIGUES, C.L.; ADDED, N.; RIZZUTTO, M.A.; TABACNIKS, M.H.; MANGIAROTTI, A.; CURADO, J.F.; AGUIRRE, F.R.; AGUERO, N.F.. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 422, p. 68-77, 2018.
Access Type: Acesso Aberto
DOI: 10.1016/j.nimb.2018.03.006
URI: https://repositorio.fei.edu.br/handle/FEI/1397
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