Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1452
Title: Comparative Experimental Study between Tensile and Compressive Uniaxially Stressed nMuGFETs under X-ray Radiation Focusing on Analog Behavior
Authors: PERUZZI, V. V.
Gimenez, S. P.
AGOPIAN, P. G. D.
SILVEIRA, M. A. G.
MARTINO, J. A.
SIMOEN, E.
CLAEYS, C.
Issue Date: 2013
Journal: ECS Transactions (Online)
ISSN: 1938-6737
Citation: PERUZZI, V. V.; Gimenez, S. P.; AGOPIAN, P. G. D.; SILVEIRA, M. A. G.; MARTINO, J. A.; SIMOEN, E.; CLAEYS, C.. Comparative Experimental Study between Tensile and Compressive Uniaxially Stressed nMuGFETs under X-ray Radiation Focusing on Analog Behavior. ECS Transactions (Online), v. 53, n. 5, p. 177-185, 2013.
Access Type: Acesso Aberto
DOI: 10.1149/05305.0177ecst
URI: https://repositorio.fei.edu.br/handle/FEI/1452
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