Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1457
Title: Analog performance of standard and uniaxial strained triple-gate SOI FinFETs under x-ray radiation
Authors: BORDALLO, C. C. M.
SILVEIRA, M. A. G.
TEIXEIRA, F. F.
MARTINO, J. A.
AGOPIAN, P. G. D.
CLAEYS, C.
SIMOEN, E.
Issue Date: 2014
Journal: Semiconductor Science and Technology
ISSN: 1361-6641
Citation: BORDALLO, C. C. M.; SILVEIRA, M. A. G.; TEIXEIRA, F. F.; MARTINO, J. A.; AGOPIAN, P. G. D.; CLAEYS, C.; SIMOEN, E.. Analog performance of standard and uniaxial strained triple-gate SOI FinFETs under x-ray radiation. Semiconductor Science and Technology, v. 29, n. 12, p. 125015, 2014.
Access Type: Acesso Aberto
DOI: 10.1088/0268-1242/29/12/125015
URI: https://repositorio.fei.edu.br/handle/FEI/1457
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