Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1466
Title: Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
Authors: CHIELLE, EDUARDO
AGUIAR, VITOR
SILVEIRA, MARCILEI A. G.
OST, LUCIANO
REIS, RICARDO
CUENCA-ASENSI, SERGIO
KASTENSMIDT, FERNANDA L.
ROSA, FELIPE
RODRIGUES, GENNARO S.
TAMBARA, LUCAS A.
TONFAT, JORGE
MACCHIONE, EDUARDO
AGUIRRE, FERNANDO
ADDED, NEMITALA
MEDINA, NILBERTO
Issue Date: 2016
Journal: IEEE Transactions on Nuclear Science
ISSN: 0018-9499
Citation: CHIELLE, EDUARDO; AGUIAR, VITOR; SILVEIRA, MARCILEI A. G.; OST, LUCIANO; REIS, RICARDO; CUENCA-ASENSI, SERGIO; KASTENSMIDT, FERNANDA L.; ROSA, FELIPE; RODRIGUES, GENNARO S.; TAMBARA, LUCAS A.; TONFAT, JORGE; MACCHIONE, EDUARDO; AGUIRRE, FERNANDO; ADDED, NEMITALA; MEDINA, NILBERTO. Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques. IEEE Transactions on Nuclear Science, v. 63, n. 4, p. 1-9, 2016.
Access Type: Acesso Aberto
DOI: 10.1109/TNS.2016.2525735
URI: https://repositorio.fei.edu.br/handle/FEI/1466
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