Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1471
Title: Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-based FPGA
Authors: TONFAT, JORGE
SILVEIRA, MARCILEI A. G.
KASTENSMIDT, FERNANDA LIMA
ARTOLA, LAURENT
HUBERT, GUILLAUME
MEDINA, NILBERTO H.
ADDED, NEMITALA
AGUIAR, VITOR A. P.
AGUIRRE, FERNANDO
MACCHIONE, EDUARDO L. A.
Issue Date: 2017
Journal: IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN: 0018-9499
Citation: TONFAT, JORGE; SILVEIRA, MARCILEI A. G.; KASTENSMIDT, FERNANDA LIMA; ARTOLA, LAURENT; HUBERT, GUILLAUME; MEDINA, NILBERTO H.; ADDED, NEMITALA; AGUIAR, VITOR A. P.; AGUIRRE, FERNANDO; MACCHIONE, EDUARDO L. A.. Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-based FPGA. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. PP, p. 1-1, 2017.
Access Type: Acesso Aberto
DOI: 10.1109/TNS.2017.2727479
URI: https://repositorio.fei.edu.br/handle/FEI/1471
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