Please use this identifier to cite or link to this item:
https://repositorio.fei.edu.br/handle/FEI/3452
Title: | Performance and Analysis of n-Type Vertically Stacked Nanowires Regarding Harmonic Distortion |
Authors: | CARVALHO, CESAR AUGUSTO BELCHIOR SILVA, GENARO MARINIELLO DA PAZ, BRUNA CARDOSO BARRAUD, SYLVAIN VINET, MAUD FAYNOT, OLIVIER Marcelo Antonio Pavanello |
Issue Date: | 11-Aug-2020 |
Abstract: | Thispaperstudies theharmonic distortion (or non-linearity) of vertically stacked SOI nanowireswith differ-ent fin widths and channel lengths. The total harmonic distor-tion and third order harmonic distortion areused as figuresof meritin this work. The harmonicdistortion analysis is per-formed taking in consideration the differences between transis-tor’s intrinsic voltage gain and transconductance over drain current ratio. |
Keywords: | stacked nanowires harmonic distortion MOSFET SOI transistor |
Journal: | JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGUÊS) |
metadata.fei.scopus.citations: | 0 |
Citation: | CARVALHO, C. A. B.; MARINIELLO, G.; PAZ, B. C.; BARRAUD, S.; VINET, M.; FAYNOT, O.; PAVANELLO, M. A. Performance and analysis of n-Type vertically stacked nanowires regarding harmonic distortion. JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGUÊS), v. 15, p. 1-5, 2020. |
Access Type: | Acesso Aberto |
DOI: | 10.29292/jics.v15i2.202 |
Appears in Collections: | Artigos |
Files in This Item:
File | Description | Size | Format | |
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Pavanello_pdf | 991.82 kB | Adobe PDF | ![]() View/Open |
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