Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/3481
Title: Effect of Interface Traps on the RTS Noise Behavior of Junctionless Nanowires
Authors: PICOLI JUNIOR, M. P.
TREVISOLI, R.
DORIA, R.T.
Issue Date: 10-Aug-2020
Abstract: This work presents a study on the effects of single interface traps throughout the Junctionless Nanowire Transistor (JNT). The results are obtained by analyzing the Random Telegraph Signal noise of the device, which consists of an exception of the generation-recombination noise. The results obtained are mostly from numerical simulation, validated through experimental data. As in physical devices, it is impossible to obtain a single trap in specific locations, we have used a distribution of traps with similar characteristics in a way that they behave like a single trap. The results show the behave considering a set of traps distributions, using an exponential model. The traps are distributed from the conduction band to the valence band.
Keywords: JNT
RTS Noise
G-r Noise
Interface Traps
Journal: JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGUÊS)
ISSN: 1807-1953
Citation: PICOLI JUNIOR, M. P.; TREVISOLI, R.; DORIA, R.T. Effect of interface traps on the RTS noise behavior of junctionless nanowires. JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS (ED. PORTUGUÊS), v. 15, n. 2, p. 1-5, 2020.
Access Type: Acesso Aberto
DOI: 10.29292/jics.v15i2.200
URI: https://repositorio.fei.edu.br/handle/FEI/3481
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