Repositório do Conhecimento Institucional do Centro Universitário FEI
 

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URI permanente para esta coleçãohttps://repositorio.fei.edu.br/handle/FEI/798

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Agora exibindo 1 - 6 de 6
  • Artigo de evento 8 Citação(ões) na Scopus
    Application of junctionless nanowire transistor in the self-cascode configuration to improve the analog performance
    (2012-09-02) Rodrido Doria; TREVISOLI, R. D.; Michelly De Souza; Marcelo Antonio Pavanello
    The self-cascode (SC) configuration consists in a series association of two transistors with tied gates usually applied to improve the analog performance of MOS devices. This paper compares the analog parameters of single Junctionless transistors with the ones presented by self-cascode associations composed by two Junctionless devices with identical or different fin widths (symmetric and asymmetric, respectively). The transconductance to the drain current ratio, the Early voltage (VEA) and the intrinsic voltage gain (AV) have been evaluated for both single devices and SC structures. It has been shown that the SC configurations, specially the asymmetric ones, present a strong reduction of the drain conductance (gD) with respect to single devices, resulting in an increase of VEA and AV, which can be higher than 30 dB depending on the bias conditions. © The Electrochemical Society.
  • Artigo de evento 1 Citação(ões) na Scopus
    Influence of 45° Substrate Rotation on the Analog Performance of Biaxially Strained-Silicon SOI MuGFETs
    (2013-05-16) DE SOUZA, M. A. S.; Rodrido Doria; MARTINO, J. A.; SIMOEN, E.; CLAEYS, C.; Marcelo Antonio Pavanello
    In this work the influence of the substrate rotation on the analog performance of strained SOI MuGFETs is presented. Measurements performed in fabricated devices show a degradation of the maximum transconductance at both linear and saturation regime. The substrate rotation has no influence on the output conductance. The intrinsic voltage gain and the unit gain frequency were extracted and presented a reduction promoted by substrate rotation, being more evident for a narrow fin. © The Electrochemical Society.
  • Artigo de evento 0 Citação(ões) na Scopus
    Analog operation of junctionless nanowire transistors down to liquid helium temperature
    (2014-07-09) TREVISOLI, R.; Michelly De Souza; Rodrido Doria; KILCHYTSHA, V.; FLANDRE, D.; Marcelo Antonio Pavanello
    The aim of this work is to analyze the analog operation of Junctionless Nanowire Transistors at temperatures down to liquid helium temperature. The analysis is performed in terms of the transconductance, open loop voltage gain and output conductance for experimental long channel devices. It is shown that the temperature reduction can affect significantly the analog performance of the devices. © 2014 IEEE.
  • Artigo de evento 4 Citação(ões) na Scopus
    Use of back gate bias to enhance the analog performance of planar FD and UTBB SOI transistors-based self-cascode structures
    (2015-10-13) Rodrido Doria; FLANDRE, D.; TREVISOLLI, R.; Michelly De Souza; Marcelo Antonio Pavanello
    This paper reports, for the first time, the use of back gate bias to improve the intrinsic voltage gain of self-cascode structures composed by planar FD and UTBB SOI MOSFETs. It is shown a voltage gain improvement larger than 10 dB when either a forward back bias is applied to the drain-side transistor or a reverse back bias is applied to the source side device.
  • Artigo de evento 6 Citação(ões) na Scopus
    Analog performance improvement of self-cascode structures composed by UTBB transistors using back gate bias
    (2015-11-20) Rodrido Doria; TREVISOLI, R.; Michelly De Souza; Marcelo Antonio Pavanello; FLANDRE, D.
    This paper explores the use of the back gate bias to enhance the analog performance of self-cascode structures composed by 25nm-long UTBB SOI MOSFETs. It is shown, for the first time, that the use of back gate bias can improve the intrinsic voltage gain by 15 dB, making it larger than the one presented by a 50nm-long single device.
  • Artigo de evento 2 Citação(ões) na Scopus
    Use of back gate bias to improve the performance of n- and p-type UTBB transistors-based self-cascode structures applied to current mirrors
    (2017-10-10) Rodrido Doria; TREVISOLI, R.; Michelly De Souza; Marcelo Antonio Pavanello; FLANDRE, D.
    This paper aims at demonstrating, for the first time, the use of back bias to improve the analog performance of current mirrors composed by self-cascode structures with 25 nm-long n- and p-type UTBB SOI MOSFETs. The use of back gate bias has shown to enhance the intrinsic gain of p-type devices by about 7 dB, making it higher than the one from a single device with equivalent channel length whereas the mirroring precision has shown to be improved by 20 % with respect to single devices.